TDM-10 desktop X-ray diffractometer

I. Application and principle X-ray diffractometer is mainly used for phase determination, quantitative analysis, crystal structure analysis, material structure analysis, crystal orientation analysis, macroscopic stress or microscopic stress measurement, grain size measurement, crystallization measurement, etc. The instrument can obtain high-precision test results according to Debye-Scheller geometry principle. X-ray diffraction instruments are widely used in institutions engaged in geology, ocean, biology, chemistry, nuclear reactor stations, industrial control laboratories and educational laboratories, as well as laboratories in colleges and universities. II. Product advantages The perfect combination of hardware system and software system of X-ray powder diffraction equipment can meet the needs of scholars and researchers in different application fields. X-ray powder diffraction equipment has a high-precision diffraction angle measurement system, which can obtain more accurate measurement results. High stability X-ray generator control system to obtain more stable repeated measurement accuracy. Various functional accessories of X-ray powder diffraction equipment can meet the requirements of different testing purposes. TDM-10 X-ray diffractometer has programmed operation and integrated structure design, convenient operation and more beautiful appearance. III. Basic principles: A beam of monochrome X-rays is irradiated on a large number of small crystals with completely random orientation, and the size of these small crystals is about 1-10 μm. To reduce preferred orientation, polycrystalline samples are usually rotated. Assuming that there is a crystal plane (hkl) satisfying the Prague reflection condition in the crystal, the incident light forms an included angle θ with the lattice plane (hkl), the included angle between the reflected light and the incident light is 2θ. Since the orientation of small crystals is arbitrary, the diffraction line of each group of (hkl) crystal plane will form a conical plane, and the angle of the conical plane for incident light corresponds to 4θ. For the crystal plane Group meeting the Prague reflection condition, the crystal plane spacing should be greater than λ/2 (I .e., sinθ Official Website：https://www.tongdatek.com/